Показать сокращенную информацию

dc.contributor.authorIbrayeva, A.
dc.contributor.authorMutali, A.
dc.contributor.authorO’Connell, J.
dc.contributor.authorSohatsky, A.
dc.contributor.authorSkuratov, V.
dc.contributor.authorAlekseeva, L.
dc.contributor.authorKorneeva, E.
dc.contributor.authorRymzhanov, R.
dc.date.accessioned2023-12-06T06:54:53Z
dc.date.available2023-12-06T06:54:53Z
dc.date.issued2022
dc.identifier.urihttp://rep.enu.kz/handle/enu/10883
dc.description.abstractWe present the first report on the structural effects induced by swift xenon ions in nanocrystalline pyrochlore Y2Ti2O7 (outside the metal matrix) studied using high resolution transmission electron microscopy. Latent amorphous tracks were observed in the range of electronic stopping powers 4.8–23.2 keV/nm. Obtained results enabled estimation of the threshold energy loss values for formation of continuous and not continuous (surface) tracks at ≈ 8 keV/nm and 3.5 keV/nm, respectively.ru
dc.language.isoenru
dc.relation.ispartofseriesVol.6(2);124-131
dc.subjectnanocrystalline materialsru
dc.subjectY2Ti2O7 pyrochloreru
dc.subjectswift heavy ionsru
dc.subjectlatent tracksru
dc.subjecttransmission electron microscopy (TEM)ru
dc.titleEvaluation of threshold conditions for latent track formation in nanocrystalline Y2Ti2O7ru
dc.typeArticleru


Файлы в этом документе

Thumbnail

Данный элемент включен в следующие коллекции

Показать сокращенную информацию