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dc.contributor.authorIbrayeva, Anel
dc.contributor.authorMutali, Alisher
dc.contributor.authorO’Connell, Jacques
dc.contributor.authorVuuren, Arno Janse van
dc.contributor.authorKorneeva, Ekaterina
dc.contributor.authorSohatsky, Alexander
dc.contributor.authorRymzhanov, Ruslan
dc.contributor.authorSkuratov, Vladimir
dc.contributor.authorAlekseeva, Liudmila
dc.contributor.authorIvanov, Igor
dc.date.accessioned2024-12-25T09:58:13Z
dc.date.available2024-12-25T09:58:13Z
dc.date.issued2022
dc.identifier.issn2352-1791
dc.identifier.otherdoi.org/10.1016/j.nme.2021.101106
dc.identifier.urihttp://rep.enu.kz/handle/enu/20384
dc.description.abstractWe report the first results of a TEM study of structural changes induced by high energy xenon and bismuth ions in Y4Al2O9 nanoparticles (10 to 100 nm grain size) in the range of electronic stopping powers 6 ÷ 35 keV/nm. It was found that swift Xe an Bi ion irradiation, starting from threshold energy loss ~ 8 keV/nm, leads to the formation of continuous amorphous latent tracks, while discontinuous tracks are observed at ~ 6 keV/nm. No effect of grain size on the ion track parameters was observed for all specific ionizing energy losses used in experiments.ru
dc.language.isoenru
dc.publisherNuclear Materials and Energyru
dc.relation.ispartofseries30 (2022) 101106;
dc.subjectSwift heavy ionsru
dc.subjectIon tracksru
dc.subjectNanoparticlesru
dc.subjectTransmission electron microscopyru
dc.titleSwift heavy ion tracks in nanocrystalline Y4Al2O9ru
dc.typeArticleru


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