Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)

dc.contributor.author	Shlimas, D.I.
dc.contributor.author	Kozlovskiy, A.L.
dc.contributor.author	Kaliekperov, M.E.
dc.contributor.author	Kadyrzhanov, K.K.
dc.contributor.author	Uglov, V.V.
dc.date.accessioned	2025-01-06T07:38:33Z
dc.date.available	2025-01-06T07:38:33Z
dc.date.issued	2020
dc.identifier.issn	2522-9869
dc.identifier.other	DOI: 10.29317/ejpfm.2020040305
dc.identifier.uri	http://rep.enu.kz/handle/enu/20647
dc.language.iso	en	ru
dc.publisher	Eurasian Journal of Physics and Functional Materials	ru
dc.relation.ispartofseries	4(3), 234-241;
dc.subject	radiation resistant coatings	ru
dc.subject	thin films	ru
dc.subject	radiation defects	ru
dc.subject	strength	ru
dc.subject	resistance to external influences	ru
dc.title	Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)	ru
dc.type	Article	ru