Thermal annealing of radiation damages produced by swift 14N and 16O ions in LiF crystals

dc.contributor.author	Sorokin, M V
dc.contributor.author	Malikova, Zh B
dc.contributor.author	Dauletbekova, A K
dc.contributor.author	Baubekova, G
dc.contributor.author	Aralbayeva, G M
dc.contributor.author	Akilbekov, A T
dc.date.accessioned	2025-01-08T06:09:47Z
dc.date.available	2025-01-08T06:09:47Z
dc.date.issued	2024
dc.identifier.issn	2053-1591
dc.identifier.other	doi.org/10.1088/2053-1591/ad5a68
dc.identifier.uri	http://rep.enu.kz/handle/enu/20682
dc.description.abstract	Annealing of color centers was studied in lithium fluoride crystals, irradiated with 23-MeV nitrogen and 28-MeV oxygen ions. Basing on the optical absorption spectroscopy and reaction-rate modelling, a new interpretation of the annealing kinetics at the practically important temperatures below 500 K is suggested. Proposed model explains simultaneous decrease of the F and F2/F3 + peaks as a result of migration of the F centers and formation of larger aggregates, and does not include additional assumptions about impurities and cation vacancies. It specifies the migration energy of the F centers in the ground state to be about 1.3 eV, that corresponds to earlier studies.	ru
dc.language.iso	en	ru
dc.publisher	Materials Research Express	ru
dc.relation.ispartofseries	11 (2024) 076201;
dc.title	Thermal annealing of radiation damages produced by swift 14N and 16O ions in LiF crystals	ru
dc.type	Article	ru