Abstract:
We present the first report on the structural effects induced by swift xenon ions in nanocrystalline
pyrochlore Y2Ti2O7 (outside the metal matrix) studied using high resolution transmission electron
microscopy. Latent amorphous tracks were observed in the range of electronic stopping powers 4.8–23.2
keV/nm. Obtained results enabled estimation of the threshold energy loss values for formation of
continuous and not continuous (surface) tracks at ≈ 8 keV/nm and 3.5 keV/nm, respectively.
