Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)

dc.contributor.author	Shlimas, D.I.
dc.contributor.author	Kozlovskiy, A.L.
dc.contributor.author	Kaliekperov, M.E.
dc.contributor.author	Kadyrzhanov, K.K.
dc.contributor.author	Uglov, V.V.
dc.date.accessioned	2023-12-04T10:58:45Z
dc.date.available	2023-12-04T10:58:45Z
dc.date.issued	2020
dc.identifier.other	DOI: 10.29317/ejpfm.2020040305
dc.identifier.uri	http://rep.enu.kz/handle/enu/10702
dc.description.abstract	The paper presents the results of changes in the strength characteristics of thin-film coatings based on compounds of copper-bismuth, copper-magnesium, copper-nickel. The dependences of the influence of the phase composition on the strength characteristics, such as the coefficient of friction, bending strength and impact coefficient, are established. The effect of irradiation with helium ions with a high radiation dose of 10 15 -10 17 ion/cm 2 on the strength characteristics is evaluated. It is shown that an increase in the radiation dose leads to a decrease in strength properties due to the appearance of a large concentration of defects in the structure.	ru
dc.language.iso	en	ru
dc.relation.ispartofseries	Vol.4(3);234-241
dc.subject	radiation resistant coatings	ru
dc.subject	thin films	ru
dc.subject	radiation defects	ru
dc.subject	strength	ru
dc.subject	resistance to external influences	ru
dc.title	Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)	ru
dc.type	Article	ru