Abstract:
We report the first results of a TEM study of structural changes induced by high energy xenon and bismuth ions in
Y4Al2O9 nanoparticles (10 to 100 nm grain size) in the range of electronic stopping powers 6 ÷ 35 keV/nm. It
was found that swift Xe an Bi ion irradiation, starting from threshold energy loss ~ 8 keV/nm, leads to the
formation of continuous amorphous latent tracks, while discontinuous tracks are observed at ~ 6 keV/nm. No
effect of grain size on the ion track parameters was observed for all specific ionizing energy losses used in
experiments.
