High-Energy Heavy Ion Tracks in Nanocrystalline Silicon Nitride

dc.contributor.author	Vuuren, Arno Janse van
dc.contributor.author	Mutali, Alisher
dc.contributor.author	Ibrayeva, Anel
dc.contributor.author	Sohatsky, Alexander
dc.contributor.author	Skuratov, Vladimir
dc.contributor.author	Akilbekov, Abdirash
dc.contributor.author	Dauletbekova, Alma
dc.contributor.author	Zdorovets, Maxim
dc.date.accessioned	2025-01-21T06:45:38Z
dc.date.available	2025-01-21T06:45:38Z
dc.date.issued	2022
dc.identifier.citation	Janse van Vuuren, A.; Mutali, A.; Ibrayeva, A.; Sohatsky, A.; Skuratov, V.; Akilbekov, A.; Dauletbekova, A.; Zdorovets, M. High-Energy Heavy Ion Tracks in Nanocrystalline Silicon Nitride. Crystals 2022, 12, 1410. https:// doi.org/10.3390/cryst12101410	ru
dc.identifier.issn	2073-4352
dc.identifier.other	doi.org/10.3390/cryst12101410
dc.identifier.uri	http://rep.enu.kz/handle/enu/20931
dc.language.iso	en	ru
dc.publisher	Crystals	ru
dc.relation.ispartofseries	12, 1410;
dc.subject	Si3N4 silicon nitride	ru
dc.subject	swift heavy ions	ru
dc.subject	latent ion tracks	ru
dc.subject	transmission electron microscopy (TEM)	ru
dc.title	High-Energy Heavy Ion Tracks in Nanocrystalline Silicon Nitride	ru
dc.type	Article	ru